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Ichikawa, Shoichi; Chiba, Yusuke; Ono, Fumiyasu; Hatori, Masakazu; Kobayashi, Takanori; Uekura, Ryoichi; Hashiri, Nobuo*; Inuzuka, Taisuke*; Kitano, Hiroshi*; Abe, Hisashi*
JAEA-Research 2016-021, 32 Pages, 2017/02
In order to reduce the influence on a plant schedule of the MONJU by the maintenance of dew point hygrometers, The JAEA examined a capacitance type dew point hygrometer as an alternative dew point hygrometer for a lithium-chloride type dew point hygrometer which had been used at the CV-LRT in the MONJU. As a result of comparing a capacitance type dew point hygrometer with a lithium-chloride type dew point hygrometer at the CV-LRT (Atmosphere: nitrogen, Testing time: 24 hours), there weren't significant difference between a capacitance type dew point hygrometer and a lithium-chloride type dew point hygrometer. As a result of comparing a capacitance dew point hygrometer with a high-mirror-surface type dew point hygrometer for long term verification (Atmosphere: air, Testing time: 24 months), the JAEA confirmed that a capacitance type dew point hygrometer satisfied the instrument specification (2.04C) required by the JEAC4203-2008.
Arisaka, Makoto; Kimura, Takaumi; Nagaishi, Ryuji; Yoshida, Zenko
Journal of Alloys and Compounds, 408-412, p.1307 - 1311, 2006/02
Times Cited Count:6 Percentile:42.74(Chemistry, Physical)no abstracts in English
Arisaka, Makoto*; Kimura, Takaumi; Suganuma, Hideo*; Yoshida, Zenko
Journal of Radioanalytical and Nuclear Chemistry, 255(2), p.385 - 389, 2003/02
Times Cited Count:5 Percentile:36.81(Chemistry, Analytical)no abstracts in English
Fujita, Reiko*; *; Kondo, Naruhito*; Utsunomiya, Kazuhiro*
JNC TJ8420 2000-004, 41 Pages, 2000/03
no abstracts in English
Yaita, Tsuyoshi; ; Tachimori, Shoichi
Journal of Physical Chemistry B, 102(20), p.3886 - 3891, 1998/00
Times Cited Count:26 Percentile:62.07(Chemistry, Physical)no abstracts in English
Hatori, Masakazu; Ichikawa, Shoichi; Chiba, Yusuke; Kobayashi, Takanori; Uekura, Ryoichi; Hashiri, Nobuo*; Inuzuka, Taisuke*; Kitano, Hiroshi*; Abe, Hisashi*; Ono, Fumiyasu
no journal, ,
In order to reduce the influence on a plant schedule of Monju by the maintenance of dew point hygrometers, JAEA Agency examined a capacitance type dew point hygrometer as an alternative dew point hygrometer for a lithium-chloride type dew point hygrometer which had been used at the containment vessel leak rate test in Monju. As a result of comparing a capacitance type dew point hygrometer with a lithium-chloride type dew point hygrometer at the CV-LRT (Atmosphere: nitrogen, testing time/24 hours), there was no significant difference between a capacitance type dew point hygrometer and a lithium-chloride type dew point hygrometer. As a result of comparing a capacitance dew point hygrometer with a high-precision-mirror-surface type dew point hygrometer for long term verification (Atmosphere: air, testing time: 24 months), it was confirmed that a capacitance type dew point hygrometer satisfied the instrument specification required by the CV-LRT. There are no other cases where atmosphere measurement has been carried out for a long time by existing measuring instruments.